The Vanta Element X-ray fluorescence (XRF) analyzer offers speed, reliability, ruggedness, connectivity, and smartphone-like ease of use in a cost-effective model. Vanta Element offers speed and ease of use in a variety of testing environments, including scrap recycling and metal manufacturing. Users can obtain clear material and grade ID in seconds and compare alloy grades on the instrument’s screen. With a dual-core processor and powered by Olympus’ Axon Technology, the Vanta Element analyzer has the same high-count rate and stability as the rest of the Vanta series for rapid sorting and a fast ROI.
Built for use in demanding environments, Vanta Element analyzers are IP54 rated for resistance to dust and moisture and constructed to pass a 4ft drop test to help keep you working in case of an accidental drop or impact. For additional protection, a stainless-steel faceplate is paired with a thick (50µm) Kapton window that can be easily attached and removed for toolless window changes in the field. If you work in hot or cold environments, you can count on the Vanta Element analyzer to perform in temperatures from -10°C to 45°C (14°F to 113°F).
The analyzer’s ruggedness features are paired with optional wireless connectivity to connect to the Olympus Scientific Cloud for wireless data sharing and access to convenient fleet management tools, the Olympus mobile app or your network, helping future proof it for Industry 4.0. The analyzer also has a 1GB microSD card for storing results and two USB ports for easy data export. For added flexibility, the Vanta Element analyzer is compatible with accessories including the Vanta field stand, soil foot, probe shield and holster.