Kansas City, Missouri – Brunson Instrument Co. has introduced the new ArmBarTM:250, a 250mm reference artifact allowing dual-process verification of the arm’s probing tip or scanner functions. Using Brunson’s patented Low Thermal Expansion (LTE) design, the ArmBar:250 gains additional stability and measurement predictability through a kinematic mount.
“We’ve listened carefully to our customers’ needs and created a metrology product that helps bring peace of mind to the CMM arm user,” says Brunson Director of Engineering Mark Meuret.
The ArmBar:250 provides critical verification for contact or non-contact devices. The reference artifact features two, 1" diameter, grade 50, satin-finish spheres and two 6mm probe tip seats. The ArmBar:250 is easily mounted to a work cart, can be bolted to a table, or clamped to any horizontal surface.
The ArmBar:250 is serialized and its lengths are certified. It’s kinematically mounted to an aluminum base plate and is portable; additionally, a protective, hard-plastic storage case is available.