The Hommel nanoscan in just one pass with a single probe can measure roughness and contour of practically any shape. The new instrument can measure surfaces with a stroke of 24mm with a resolution of 0.68Nm over the entire measuring range. Capable of complex measuring tasks, nanoscan features an innovative integrated software/hardware concept that enables users to capture micro- and macro-structures of parts with very narrow tolerances in short cycle times.
Measurement tasks can be set up and performed on the operator panel while CNC-controlled axes allow fully automatic measurement runs in short cycles with guaranteed reproducible measuring results.
IMTS BOOTH D-4535
Hommel-Etamic
Rochester Hills, MI
hommel-etamic.com
Explore the July August 2008 Issue
Check out more from this issue and find your next story to read.
Latest from Aerospace Manufacturing and Design
- Mitutoyo's Metlogix M3 with the Mitutoyo Quick Image Vision System
- IMTS 2024 Booth Tour: SW North America
- Eve Air Mobility receives $50 million
- Starrett's AVR400 vision metrology system
- IMTS 2024 Booth Tour: HAINBUCH America Corporation
- Applications open for 2025 EAA Aviation scholarships
- Join us for the latest in robotics and automation for manufacturing
- Learn to navigate the challenges of contracting with the Department of Defense